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Moolaii/Semiconductor
03 / SEMICONDUCTOR

Intelligence
meets silicon.

AI-assisted RTL and verification is the lead story. Architecture, lint, simulation, and synthesis notes are the intended loop. The FIFO walkthrough below is a written example, not a live product run.

MLI // RTLINTERNAL PROTOTYPE
01

Architecture

System requirements and microarchitecture.

02

RTL Design

Verilog / SystemVerilog engineering.

03

Verification

Simulation, UVM and formal verification.

04

Synthesis

Design readiness and optimization.

05

AI-Assisted Engineering

Intelligent workflows across chip development.

INTERACTIVE SYSTEM MAP

Select a stage to trace its inputs, engineering work, and feedback into the next cycle. Auto-playing — click any stage to take control.

AI-TO-HARDWARE / 01

Models turn engineering intent into actionable architecture.

Knowledge, specifications, and prior designs inform RTL generation, review, and implementation choices.

INPUTSSpecifications · prior IP · engineering knowledge
OUTPUTSDesign constraints · architecture options · RTL intent
NEXT CONNECTIONStructured intent feeds RTL Design →
HARDWARE DESCRIPTION / 02

RTL makes intelligence structurally precise.

SystemVerilog modules express the architecture while agents inspect interfaces, timing assumptions, and reusable IP.

INPUTSArchitecture · protocols · timing constraints
OUTPUTSSynthesizable RTL · assertions · test intent
NEXT CONNECTIONExecutable design enters Verification →
EVIDENCE LOOP / 03

Verification converts behavior into evidence.

Simulation and coverage expose failures. A passing testbench is evidence for that testbench. It is not a claim of unrestricted correctness.

INPUTSRTL · assertions · test plans · requirements
OUTPUTSCoverage · counterexamples · testbench results
NEXT CONNECTIONEvidence qualifies Silicon Optimization →
SILICON FEEDBACK / 04

Optimization closes the loop from silicon to intelligence.

Power, performance, area, and timing results can change the next architecture choice and the prompts or rules given to a later draft. That is not the same as retraining model weights.

INPUTSChecked RTL · PPA targets · technology data
OUTPUTSOptimized netlist · timing and power evidence
LOOP CONNECTIONMeasured results update architecture notes and agent guidance ↻
RTL workflow

One inspectable example.

Written walkthrough of the intended loop: spec, draft, lint, simulation, correction. This is not a live Moolaii run and not a log from a public CLI. A passing testbench here means that testbench passed.

  1. 01 · Spec

    What to build

    sync FIFO, 8-bit data, depth 4
    clk, rst_n, wr_en, rd_en, din[7:0]
    dout[7:0], full, empty
    one clock domain
    simultaneous write+read must keep occupancy unchanged
    overflow and underflow must be ignored
  2. 02 · Draft

    First occupancy logic

    always_ff @(posedge clk) begin
      if (wr_en) count <= count + 1'b1;
      if (rd_en) count <= count - 1'b1; // overwrites the write
    end
  3. 03 · Lint

    What a reviewer should catch

    W1  fifo.sv:14  both wr_en and rd_en assign count
         last assignment wins; occupancy is wrong on wr+rd
    W2  fifo.sv:18  full/empty derived from count without
         a wrap guard when wr+rd both fire
  4. 04 · Simulate

    The overlap case fails

    t=40  wr+rd  count 3→2   expected 3
    FAIL  occupancy dropped on simultaneous wr+rd
    PASS  4 writes then empty after 4 reads (no overlap)
  5. 05 · Correct

    Keep count on wr+rd

    if (wr_en && rd_en && !empty && !full) count <= count;
    else if (wr_en && !full)               count <= count + 1'b1;
    else if (rd_en && !empty)              count <= count - 1'b1;
  6. 06 · Recheck

    That testbench now passes

    t=40  wr+rd  count stays 3
    PASS  occupancy on simultaneous wr+rd
    PASS  fill to full, drain to empty
    4 writes, 4 reads, 2 overlap cycles

Limits: one clock domain, depth 4, no CDC, no synthesis, no timing closure, no formal proof. Questions about this example: [email protected].

WHERE AI HELPS

Engineering, accelerated.

Intended assistance at the points where chip teams lose the most time. Labels say what is built versus planned.

SI-01

Spec to RTL

Turn interface specs and microarchitecture notes into draft SystemVerilog.

Internal prototype
SI-02

Lint & review

Catch structural issues, CDC risks and style drift before simulation.

Planned
SI-03

Coverage closure

Suggest tests and assertions that target the holes in your coverage.

Planned
SI-04

PPA exploration

Compare power, performance and area trade-offs across design options.

Planned
05 / ENGINEERING FLOW

From idea to silicon.

01

Idea

Define intent
02

Research

Connect knowledge
03

Architecture

Model systems
04

RTL

Describe hardware
05

Verification

Prove behavior
06

Silicon

Realize compute
Moolaii — Deep Intelligence · SemiconductorPRIVATE PREVIEW · RTL FIRST

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